System for testing semiconductor components having interconnect with variable flexure contacts

ABSTRACT

A test system for testing semiconductor components includes an interconnect having a substrate and contacts on the substrate for electrically engaging terminal contacts on the components. The interconnect also includes one or more cavities in the substrate which form flexible segments proximate to the interconnect contacts. The flexible segments permit the interconnect contacts to move independently in the z-direction to accommodate variations in the height and planarity of the terminal contacts. In addition, the cavities can be pressurized, or alternately filled with a polymer material, to adjust a compliancy of the flexible segments. Different embodiments of the interconnect contacts include: metallized recesses for retaining the terminal contacts, metallized projections for penetrating the terminal contacts, metallized recesses with penetrating projections, and leads contained on a polymer tape and cantilevered over metallized recesses. The test system can be configured for testing wafer sized components, such as wafers and boards, or for testing die sized components, such as unpackaged dice and chip scale packages.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a division of Ser. No. 11/208,995, filed on Aug. 22,2005, which is a division of Ser. No. 10/329,212, filed on Dec. 24,2002, U.S. Pat. No. 6,982,564, which is a continuation of Ser. No.09/729,114, filed on Dec. 4, 2000, U.S. Pat. No. 6,498,503, which is adivision of Ser. No. 09/340,879, filed on Jun. 28, 1999, U.S. Pat. No.6,310,484 B1, which is a continuation-in-part of Ser. No. 08/972,088,filed on Nov. 17, 1997, U.S. Pat. No. 6,072,321, which is a division ofSer. No. 08/625,281, filed on Apr. 1, 1996, U.S. Pat. No. 5,869,974.

FIELD OF THE INVENTION

This invention relates generally to semiconductor testing, andspecifically to an improved system for electrically testingsemiconductor components such as dice, packages, wafers, panels, boards,and electronic assemblies containing dice or packages.

BACKGROUND OF THE INVENTION

Semiconductor components, such as bare dice, chip scale packages, BGAdevices and wafers can include terminal contacts in the form of bumpedcontacts. This type of component is sometimes referred to as a “bumped”component (e.g., bumped die, bumped wafer). The bumped contacts providea high input/output capability for a component, and permit the componentto be surface mounted, or alternately flip chip mounted, to a matingsubstrate, such as a printed circuit board (PCB). Typically, the bumpedcontacts comprise solder bumps or balls, which permit the components tobe bonded to the mating substrate using a solder reflow process. Forsome components, such as chip scale packages and BGA devices, the bumpedcontacts can be arranged in a dense array, such as a ball grid array(BGA), or a fine ball grid array (FBGA).

Rather than bumped contacts, semiconductor components can also includeterminal contacts in the form of pin contacts, or spring contacts. Forexample, U.S. Pat. No. 5,496,667 to Farnworth et al. discloses pincontacts, and spring contacts, on unpackaged semiconductor dice.

For performing test procedures on semiconductor components temporaryelectrical connections must be made with the terminal contacts.Different types of interconnects have been developed for making thesetemporary electrical connections. For example, a wafer probe card is onetype of interconnect that is used to test semiconductor wafers. Anothertype of interconnect, is contained within a carrier for temporarilypackaging singulated components, such as bare dice and chip scalepackages, for test and burn-in. In either case, the interconnectsinclude interconnect contacts that make the temporary electricalconnections with the terminal contacts on the components.

One problem with making these temporary electrical connections is thatvariations can occur in the planarity, size, and location of theterminal contacts on the components. For example, the planarity ofbumped contacts can vary due to variations in height and diameter of thebumps. Similarly, pin contacts or spring contacts can have differentheights and diameters. These variations can occur between the terminalcontacts on the same component, and between the terminal contacts ondifferent components. It is advantageous for an interconnect to be ableto accommodate these variations, particularly variations in the heightand planarity of the terminal contacts. This problem is compoundedbecause the interconnect contacts must penetrate native oxide layers onthe terminal contacts to make low resistance electrical connections.

The present invention is directed to an interconnect for makingtemporary electrical connections with semiconductor components havingterminal contacts in the form of bumps, pins or springs.

SUMMARY OF THE INVENTION

In accordance with the present invention, an improved interconnect fortesting semiconductor components is provided. Also provided, are a testsystem incorporating the interconnect, a method for fabricating theinterconnect, and a testing method employing the interconnect.

The interconnect includes a substrate, and a plurality of interconnectcontacts on the substrate configured to electrically engage terminalcontacts on the components, such as bumped contacts, pin contacts orspring contacts. Several different embodiments of the interconnectcontacts are provided including: metallized recesses sized and shaped toretain the terminal contacts; metallized penetrating projectionsconfigured to penetrate the terminal contacts; metallized recesses withpenetrating projections; and metal leads on polymer tape cantileveredover metallized recesses.

The interconnect also includes one or more cavities in the substrateconfigured to form flexible segments of the substrate, that allow theinterconnect contacts to flex, and to move independently of one another,to accommodate variations in the size, location and planarity of theterminal contacts. A location and size of the cavities can be selectedto form the flexible segments, with a desired compliancy, or springconstant. In addition, the cavities can be in flow communication with apressurized fluid or gas source, such that a flexure of the interconnectcontacts can be adjusted as required, for a particular testingapplication. Also, the pressurized cavities permit a variable backsidebiasing force to be exerted on the flexible segments, to counteract abiasing force applied from a front side of the interconnect by a testingapparatus such as a wafer prober or test carrier. Alternately, thecavities can be filled with an elastomeric material, selected to providea desired compliancy, or spring constant, for the flexible segments andthe substrate.

In a first embodiment the cavities comprise separate pockets, alignedwith individual interconnect contacts. In a second embodiment thecavities comprise elongated grooves aligned with multiple interconnectcontacts. In a third embodiment the cavity comprises a single pocketlarge enough to encompass a periphery of multiple interconnect contacts.The interconnect can be configured for die level testing of discretecomponents, such as bare dice or chip scale packages, or alternately forwafer level testing of multiple components contained on a commonsubstrate, such as a wafer, a panel, a circuit board, or an electronicassembly. For a die level test system, the interconnect is configuredfor assembly in a testing apparatus, such as a carrier, configured toretain one or more components in electrical communication with testingcircuitry. The testing apparatus includes a base on which theinterconnect is mounted, and a force applying mechanism for biasing thecomponents against the interconnect. For a wafer level test system, theinterconnect is configured for use with a wafer testing apparatus, suchas a wafer prober, or a wafer level burn-in system. In an illustrativewafer level test system the interconnect replaces a conventional probecard.

In an illustrative fabrication method, the interconnect comprises anetchable material such as silicon or ceramic, such that etching andmetallization processes can be used to fabricate the interconnectcontacts and cavities. Alternately the interconnect can compriseplastic, such that micro-molding and metallization processes can be usedto fabricate the interconnect contacts and cavities.

The test method includes the steps of: providing the interconnect,electrically engaging the component using the interconnect, and thenallowing the interconnect contacts to move independently with a biasingforce to accommodate variations in the size and planarity of theterminal contacts on the component. In addition, the test method caninclude the step of introducing a pressure into the cavities foradjusting a flexure of the interconnect contacts. The test method canalso include the step of applying a front side biasing force, as well asa backside biasing force, to the interconnect contacts.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic plan view of an interconnect constructed inaccordance with the invention;

FIG. 1A is a plan view of an alternate embodiment wafer levelinterconnect constructed in accordance with the invention;

FIG. 2 is a side elevation view of FIG. 1;

FIG. 3 is an enlarged cross sectional view taken along section line 3-3of FIG. 1 illustrating an interconnect contact electrically engaging abumped contact on a semiconductor component;

FIG. 3A is an enlarged cross sectional view equivalent to FIG. 3 of analternate embodiment interconnect contact electrically engaging a pincontact;

FIG. 3B is an enlarged cross sectional view equivalent to FIG. 3 of analternate embodiment interconnect contact electrically engaging thebumped contact;

FIG. 4 is an enlarged cross sectional view equivalent to FIG. 3 ofanother alternate embodiment interconnect contact electrically engagingthe bumped contact;

FIG. 4A is an enlarged cross sectional view equivalent to FIG. 4 ofanother alternate embodiment interconnect contact electrically engagingthe bumped contact;

FIG. 5 is an enlarged cross sectional view equivalent to FIG. 3 ofanother alternate embodiment interconnect contact;

FIG. 5A is an enlarged cross sectional view equivalent to FIG. 5 of theanother alternate embodiment interconnect electrically engaging thebumped contact;

FIG. 6A is an enlarged cross sectional view equivalent to FIG. 3 ofanother alternate embodiment interconnect contact;

FIG. 6B is an enlarged cross sectional view of the interconnect contactof FIG. 6A electrically engaging the bumped contact;

FIG. 6C is a plan view taken along section line 6C-6C of FIG. 6A;

FIG. 6D is a bottom view taken along section line 6D-6D of FIG. 6B;

FIGS. 7A-7D are schematic cross sectional views illustrating steps in amethod for fabricating the interconnect contact of FIG. 3;

FIGS. 7E-7F are schematic cross sectional views illustrating steps in amethod for fabricating the interconnect contact of FIG. 3A;

FIGS. 8A-8D are schematic cross sectional views illustrating steps in amethod for fabricating the interconnect contact of FIG. 4;

FIG. 8E is a schematic cross sectional view illustrating a step in amethod for fabricating the interconnect contact of FIG. 4A;

FIGS. 9A-9D are schematic cross sectional views illustrating steps in amethod for fabricating the interconnect contact of FIG. 5;

FIGS. 10A-10E are schematic cross sectional views illustrating steps ina method for fabricating the interconnect contact of FIG. 6A;

FIG. 11 is a schematic diagram of a wafer level test system constructedin accordance with the invention;

FIG. 11A is a schematic diagram of an alternate embodiment wafer leveltest system;

FIG. 12A is a plan view of a die level test system constructed inaccordance with the invention; and

FIG. 12B is a cross sectional view taken along section line 12B-12B ofFIG. 12A.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

As used herein, the term “semiconductor component” refers to anelectronic component, or assembly, that includes a semiconductor die.Exemplary semiconductor components include bare semiconductor dice, chipscale packages, ceramic or plastic semiconductor packages, BGA devices,semiconductor wafers, panels containing multiple chip scale packages,circuit boards, and electronic assemblies such as field emissiondisplays.

Referring to FIGS. 1-3, an interconnect 10 constructed in accordancewith the invention is illustrated. The interconnect 10 includes asubstrate 12, and a pattern of interconnect contacts 14 formed on thesubstrate 12. In the embodiment of FIG. 1, the interconnect 10 isconfigured for use with a singulated component 18 (FIG. 3) such as abare semiconductor die, or a chip scale package. Alternately, asillustrated in FIG. 1A, an interconnect 10W can be configured for usewith a wafer sized component 18W (FIG. 11) such as a semiconductorwafer, a panel, a board, or an electronic assembly.

Also in the embodiment of FIG. 1, the contacts 14 are configured toelectrically engage bumped contacts 16 (FIG. 3) on a semiconductorcomponent 18 (FIG. 3). The bumped contacts 16 (FIG. 3) are in electricalcommunication with the integrated circuits contained on the component18, and function as electrical connection points from the outside forapplying electronic signals to the integrated circuits. In addition, thebumped contacts 16 are depicted as generally spherically shaped ballsattached to planar land pads 19. However, other shapes for the bumpedcontacts 16 such as half-spheres, domes, truncated cones, and hillockscan be electrically engaged using an interconnect constructed inaccordance with the invention. Also, the bumped contacts 16 can comprisea metal such as solder, nickel or copper, or a conductive polymer, suchas silver filled silicone, or fluorsilicone. Alternately, as shown inFIG. 3A, contacts 14P can be configured to electrically engage pincontacts 16P (or spring contacts), as disclosed in previously cited U.S.Pat. No. 5,495,667 to Farnworth et al.

As shown in FIG. 2, the interconnect 10 also includes a plurality ofcavities 20 (FIG. 2), which form flexible segments 26 (FIG. 3) proximateto the contacts 14. During a test procedure performed using theinterconnect 10, the flexible segments 26 allow the contacts 14 to flex,and to move independently in the z-direction relative to the component18, in a manner to be hereinafter explained.

As also shown in FIG. 2, the substrate 12 comprises a generally planarstructure having a front side 22 (first side), an opposing back side 24(second side), and a thickness “T”. The contacts 14 are formed on thefront side 22 of the substrate 12, and the cavities 20 are formed on theback side 24 of the substrate 12. A size and peripheral shape of thesubstrate 12 can be selected as required.

Suitable materials for the substrate 12 include silicon, ceramic, andplastic. Depending on the material, the thickness T of the substrate 12can be selected as required, with 10-50 mils or more being arepresentative thickness.

The interconnect contacts 14 are formed with a pattern (i.e., pitch andnumber) that exactly matches a pattern of the bumped contacts 16 on thesemiconductor component 18. In the illustrative embodiment the patternis four sided, to match a peripheral array pattern. However, theinterconnect contacts 14 can be formed in any matching pattern used forsemiconductor components. Representative patterns include dense gridarrays, such as a ball grid array (BGA), and linear patterns, such ascenter connect, or edge connect patterns.

In FIG. 2A, the cavities 20 are formed on the backside 24 of thesubstrate 12 substantially aligned with the interconnect contacts 14 onthe front side 22 of the substrate 12. In addition, the cavities 20 havesizes and peripheral configurations, that are substantially the same asthe sizes and peripheral configurations of the interconnect contacts 14.As illustrated the cavities 20 have a generally square peripheralconfiguration, but other geometrical shapes can be employed (e.g.,rectangular, circular, oval). A depth “d” (FIG. 3) of the cavities 20can be selected to provide the flexible segments 26 with a desiredthickness “t” (FIG. 3). This thickness t is relatively small such thatthe flexible segment 26 is a thin membrane capable of deflection uponapplication of a moderate force.

A representative range for the thickness t of the flexible segment 26can be from about 0.25-30 mils. The thickness t can also be selected toachieve a desired spring constant (C) for the flexible segment 26. Thespring constant (C) is dependent on the dimensions and material for theflexible segment 26. These parameters can be related by the formula:C=E w t ³/4 l³where C is the spring constant

w is the width of the flexible segment 26

t is the thickness of the flexible segment 26

l is the length of the flexible segment 26

E is the modulus of elasticity of the substrate

An alternate embodiment cavity 20B (FIG. 3B) can be formed on the backside 24 of a substrate 12A substantially as previously described forcavities 20 (FIG. 2A). However, rather than being aligned withindividual contacts 14, the cavity 20B substantially encloses all of thecontacts 14. In addition, peripheral edges of the cavity 20Bsubstantially align with the outside peripheral edges of the contacts14.

Alternate embodiment cavities 20A (FIG. 3) can also be formed on theback side 24 of a substrate 12B substantially as previously describedfor cavities 20 (FIG. 2A). However, rather than being aligned withindividual contacts 14, the cavities 20A comprise elongated grooves thatalign with multiple contacts 14. In addition, peripheral edges of thecavities 20A substantially align with the outside peripheral edges ofthe contacts 14.

Referring to FIG. 3, the interconnect contact 14 is shown electricallyengaging the bumped contact 16. The interconnect contact 14 comprises arecess 38 formed in the substrate 12, and a conductive layer 30 at leastpartially covering the recess 38.

The recess 38 is sized and shaped to retain the bumped contact 16. Aswill be further explained, the recess 38 can be formed by forming a mask(not shown) on the substrate 12, such as a photo patterned resist mask,and then etching the substrate 12 through an opening in the mask, usingan etchant. A size and shape of the recess 38 will be determined by theopening in the etch mask used to etch the substrate 12. The recess 38 isconfigured to retain and electrically engage a single bumped contact 16.A representative diameter, or width, of the recess 38 can be from 0.002inches (0.051 mm) to 0.050 inches (1.27 mm) or more. This diameter canbe less than a diameter of the bumped contact 16 so that only portionsthereof will be contacted. A depth of the recess 38 can be equal to, orless than, the diameter thereof. A pitch (or spacing) of the recess 38relative to adjacent recesses 38 will exactly match a pitch of thebumped contacts 16 on the component 18.

As also shown in FIG. 3, the conductive layer 30 substantially coversthe recess 38. In addition, peripheral edges 36 of the conductive layer30 are adapted to penetrate the bumped contact 16 to pierce native oxidelayers and contact the underlying metal. The conductive layer 30 is inelectrical communication with a conductor 32, and with a bonding pad 34on the substrate 12. The bonding pad 34 can be bonded to a wire 44,which forms an electrical path to the conductor 32, and to theconductive layer 30. As will be further explained, the wire 44 can alsobe bonded to a mating bonding pad on a test apparatus, such as a testcarrier or wafer prober, which is in electrical communication with testcircuitry.

The conductive layers 30, the conductors 32 and the bonding pads 34 canbe made using semiconductor fabrication techniques (e.g.,photolithography, etching, metallization) to be hereinafter described.Also, with the substrate 12 comprising silicon, electrically insulatinglayers 28, such as SiO₂, or a polymer material such as polyimide, can beformed on exposed surfaces to provide electrical insulation for theconductive layers 30, the conductors 32 and the bonding pads 34, fromthe remainder of the substrate 12. If the substrate 12 comprises anelectrically insulating material such as ceramic or plastic, theinsulating layers 28 are not required.

Suitable metals for the conductive layers 30 and the conductors 32include aluminum, chromium, titanium, nickel, iridium, copper, gold,tungsten, silver, platinum, palladium, tantalum, molybdenum or alloys ofthese metals such as TiSi₂. The conductive layers 30, and the conductors32 can be formed as a single layer of metal, or as a multi metal stack,using a thin film metallization process (e.g., CVD, patterning, etchingor electroplating). Alternately, a thick film metallization process(e.g., screen printing, stenciling) can be used to form the conductivelayers 30 and the conductors 32.

The alternate embodiment contact 14P of FIG. 3A can be constructedsubstantially as described for contact 14 (FIG. 3) but sized to engagethe pin contact 16P.

As shown in FIG. 3, during a test procedure, a biasing force F can beapplied to the component 18 (or to the interconnect 10) for biasing thecomponent 18 and the interconnect 10 together. As will be furtherexplained, the biasing force F can be generated by the test apparatus(e.g., wafer prober, test carrier) on which the interconnect 10 ismounted. During biasing, the flexible segment 26 allows the interconnectcontact 14 to move as the bumped contact 16 on the component 18 ispressed into the interconnect contact 14. For example, the flexiblesegment 26 can bow outward as indicated by the dotted lines in FIG. 3,permitting deflection of the interconnect contact 14 by an amount ΔZ.This movement can compensate for variations in the size (i.e., height,diameter) and the planarity of the bumped contacts 14. In addition,different contacts 16 on the substrate 12 can move independently of oneanother. This allows the z-direction location of the contacts 14 toadjust to the location of the bumped contacts 16 on the component 18.

The amount of the deflection ΔZ can be controlled by selection of theforce F, and by selection of the spring constant C for the flexiblesegment 26. By way of example, and not limitation, a representativerange for the deflection ΔZ can be from several microns to several mils.

Referring to FIG. 3B, the alternate embodiment substrate 12A and cavity20B are illustrated. The cavity 20B was previously shown in FIG. 2B, andhas a peripheral outline that is larger than the area occupied by thecontacts 14 on the front side 22 of the substrate 12A. In addition, thecavity 20B can be in flow communication with a pressure conduit 40 whichis coupled to a pressure source 42. As will be further explained thepressure conduit 40 is preferably contained on a separate mountingsubstrate for the interconnect 10. Alternately, the pressure conduit 40can comprise a passageway in the substrate 12A.

The pressure source 42 can comprise a source of compressed gas, such asair, or a source of pressurized fluid, such as water or oil. Using thepressure source 42 and the pressure conduit 40, gas or liquid pressurecan be applied to the cavity 20B. This exerts a backside force F2 on theflexible segments 26A, and on a backside of the interconnect contacts14. At the same time, a front side force F1 can be exerted by thetesting apparatus on the component 18, on the bumped contacts 16, and onthe front side of the interconnect contacts 14, substantially aspreviously described. The backside force F2 can be selected relative tothe front side force F1 such that a desired net biasing force biases theinterconnect contacts 14 and the bumped contacts 16 together.

Referring to FIG. 4, an alternate embodiment interconnect contact 14A isillustrated. The interconnect contact 14A comprises a metallizedprojection on the substrate 12 which can be formed using an etchingprocess to be hereinafter described. The interconnect contact 14A issized and shaped to penetrate the bumped contact 16 on the component 18.A representative width for the interconnect contact 14A, for a bumpedcontact 16 having a diameter of about 0.35 mm, can be about 20-50 μm ona side, and about 50-100 μm high.

As with the interconnect contact 14, the interconnect contact 14A is atleast partially covered with a conductive layer 30A. The conductivelayer 30A is in electrical communication with a conductor 32A, and witha bonding pad 34A on the substrate 12. In addition, previously describedelectrically insulating layers 28, electrically insulate the conductivelayer 30A and conductor 32A from the substrate 12. As with interconnectcontact 14, the interconnect contact 14A is located on the front side 22of the substrate 12, and the cavity 20 or 20A is located on the backside 24 of the substrate 12. In addition, the cavity 20 or 20A allowsthe contact 14A to move in the z-direction relative to the component 18to compensate for variations in the size and planarity of the bumpedcontact 16.

Referring to FIG. 4A, the interconnect contact 14A is illustrated on thesubstrate 12A having the previously described single cavity 20B.However, in this embodiment an elastomer 46 is placed in the cavity 20Bto provide a resilient backing for the flexible segment 26A, and thus adesired compliancy or flexibility for the substrate 12A, and for theinterconnect contacts 14A on the substrate 12A. The elastomer 46 cancomprise a resilient, flexible material, such as silicone, butyl rubber,or an elastomeric foam.

Referring to FIG. 5, an alternate embodiment interconnect contact 14B isillustrated. The interconnect contact 14B is substantially similar tothe interconnect contact 14 (FIG. 3) previously described. Theinterconnect contact 14B comprises a recess 38B in the substrate 12sized and shaped to retain, and center the bumped contact 16. Inaddition, the interconnect contact 14B includes at least one projection48 within the recess 38B for penetrating the bumped contact 16. Therecess 38B and projection 48 are at least partially covered withconductive layer 30B, substantially equivalent to the conductive layer30 (FIG. 3) previously described. In addition, previously describedinsulating layers 28 electrically insulate the conductive layer 30B andconductor 32B. As with the previous embodiments, the cavity 20 or 20Aforms flexible segment 26C that allows the interconnect contact 14B tomove independently in the z-direction, to accommodate variations in thesize and planarity of the bumped contact 16 relative to other bumpedcontacts 16 on the component 18.

Referring to FIG. 5A, the interconnect contact 14B is illustrated on thesubstrate 12A having the previously described single cavity 20B. Inaddition, the cavity 20B is in flow communication with the pressureconduit 40 and the pressure source 42, such that the forces F1 and F2can be adjusted as previously described.

Referring to FIGS. 6A-6D an alternate embodiment interconnect contact14C is illustrated. The interconnect contact 14C includes a recess 38Cformed on a front side 22C of a substrate 12C, substantially aspreviously described. In addition, the recess 38C is at least partiallycovered with a conductive layer 30C, substantially as previouslydescribed. Electrically insulating layers 28C, such as SiO₂, or apolymer layer, electrically insulate the conductive layer 30C from abulk of the substrate 12C. If the substrate 12C comprises anelectrically insulating material such as ceramic or plastic, theinsulating layers 28C are not required.

The interconnect contact 14C also includes a polymer tape 50 similar tomulti layered TAB tape used widely in semiconductor packaging. As willbe more fully described, the polymer tape 50 can be formed separatelyout of polyimide, or similar material, and then attached to the frontside 22C of the substrate 12C. The polymer tape 50 includes leads 52configured to cantilever over the recess 38C, and to electrically engagethe bumped contact 16. The leads 52 can move independently in thez-direction relative to the leads on other interconnect contacts 14C, toaccommodate variations in the size or planarity of the bumped contacts16. In the illustrative embodiment there are four leads 52 arranged in agenerally orthogonal, spoke-like pattern. However, a greater or lessernumber of leads 52 and other patterns for the leads 52 (e.g., spiral)can be employed. The leads 52 can be formed by depositing (e.g.,electrodepositing) or attaching (e.g., laminating) a metal layer to thepolymer tape 50 and then patterning the metal layer. The leads 52include a generally square-shaped, integrally-formed, connecting segment56 that connects the leads 52 to one another. Also, openings 54 can beformed in the polymer tape 50, by etching or other suitable process, ina pattern that corresponds to the pattern of the recesses 38C. Theopenings 54 provide access to the leads 52 for the bumped contact 16.

Still referring to FIG. 6A, the interconnect contact 14C also includes aconductive via 58 in the substrate 12C in electrical communication withthe conductive layer 30C. The conductive via 58 can be formed using alaser machining process to be hereinafter described. The conductive via58 includes a contact pad 60 formed on a back side 24C of the substrate12C. In addition, electrically insulating layers 28C electricallyinsulate the conductive via 58 and the contact pad 60. The conductivevia 58 and the contact pad 60 provide a conductive path from the backside 24C of the substrate 12C to the conductive layer 30C for theinterconnect contact 14C located on the front side 22C of the substrate12C. The conductive layer 30C is also in electrical communication with aconductive polymer layer 62 on the substrate 12C. The conductive polymerlayer 62 electrically connects the conductive layer 30C to the leads 52.The conductive polymer layer 62 can comprise an isotropic conductivematerial, such as silver filled silicone or flourosilicone, or ananisotropic conductive material such as a z-axis anisotropic adhesive.

Referring to FIGS. 7A-7D, steps in a method for fabricating theinterconnect 10 with interconnect contacts 14 (FIG. 3) are illustrated.Initially, the substrate 12 having the front side 22 and the backside 24can be provided. Preferably the substrate 12 comprises a wafer ofmaterial, such that a wafer level fabrication process can be employed tomake the interconnect 10. In the case of a wafer level interconnect 10W(FIG. 1A), the substrate 12 can have the same size and peripheralconfiguration as the completed interconnect 10W. In the case of a dielevel interconnect 10 (FIG. 1), a singulation process, such as cuttingor shearing, can be used to separate multiple interconnects 10 from thesubstrate 12. The separated interconnects 10 will then have a peripheralshape corresponding to the component being tested.

The substrate 12 can comprise an etchable material such asmonocrystalline silicon, silicon-on-glass, silicon-on-sapphire, orgermanium. The substrate 12 can also comprise a plastic material such asa glass reinforced resin (e.g., FR-4), or a moldable electronics gradeplastic such as a thermoplastic plastic, a thermosetting plastic or aliquid crystal polymer. A representative thickness of the substrate 12can be about 20-50 mils or greater.

Next, as shown in FIG. 7B, a front side etch mask 64 can be formed onthe front side 22 of the substrate 12, and used to etch the recess 38.Similarly, a back side etch mask 66 can be formed on the back side 24 ofthe substrate 12, and used to etch the cavity 20 or 20A. The etch masks64, 66 can comprise a polymer resist, or a hard mask such as Si₃N₄. Inaddition, a wet etchant, such as KOH for silicon, can be used toanisotropically etch the substrate 12 through openings in the masks 64,66. Alternately an isotropic etch process, with a wet etchant such asHF/HNO₃ for silicon, can be employed. If the substrate 12 comprisesceramic, a suitable wet etchant, such as HF, can be utilized to etch therecess 38 and the cavity 20 or 20A. If the substrate 12 comprisesplastic rather than an etchable material, a micro molding process can beused to form the recess 38, and the cavity 20 or 20A.

In the illustrative embodiment the recess 38 and the cavity 20 or 20Ahave a same depth and a same width. Alternately, separate etch processescan be employed such that the recess 38 and the cavity 20 or 20A can beformed with different depths and widths. The thickness of the substrate12, and the depth of the recess 38 and cavity 20 or 20A, can be selectedto form the flexible segment 26 with a desired thickness t.

Next, as shown in FIG. 7C, the insulating layers 28 can be formed withinthe recess 38, within the cavity 20 or 20A, on the front side 22 of thesubstrate 12, and on the back side 24 of the substrate 12. Theinsulating layers 28 can comprise an electrically insulating material,such as SiO₂, or Si₃N₄, deposited to a desired thickness using CVD, orother deposition process. With silicon, a SiO₂ layer can also be grownon exposed surfaces of the substrate 12 using an oxidizing atmospheresuch as steam and O₂ at an elevated temperature (e.g., 950° C.). Theinsulating layers 28 can also comprise an electrically insulatingpolymer, such as polyimide, deposited and planarized using a suitableprocess (e.g., spin-on-process). Depending on the material, arepresentative thickness of the insulating layers 28 can be from about a100 Å to several mils. If the substrate 12 comprises an electricallyinsulating material such as ceramic or plastic, the insulating layers 28are not required.

Next, as shown in FIG. 7D, the conductive layer 30 can be formed on therecess 38. The conductive layer 30 can comprise a thin film metaldeposited to a thickness of several hundred Å, or more, using a processsuch as CVD. In the illustrative embodiment the conductive layer 30completely covers the recess 38, and as shown in FIG. 1 has a generallysquare peripheral configuration. Alternately, the conductive layer 30can partially cover the recess 38, and can be formed with a differentperipheral configuration (e.g., circular, rectangular, oval).

As also shown in FIG. 7D, the conductors 32 and the bonding pads 34 canbe formed at the same time as the conductive layer 30, or can be formedusing a separate metallization process. The conductive layers 30 andconductors 32 can comprise a patterned layer of a conductive metal suchas aluminum, chromium, titanium, nickel, iridium, copper, gold,tungsten, silver, platinum, palladium, tantalum, molybdenum, or alloysof these metals such as TiSi₂. Rather than being a single layer ofmetal, the conductive layer 30 and the conductors 32 can comprisemulti-layered stacks of metals (e.g., bonding layer/barrier layer). Thebonding pads 34 can be formed using a same process as the conductors 32or can be formed separately. Preferably the bonding pads 34 comprise ametal, such as aluminum or copper, on which wire bonds can be easilyformed.

As shown in FIG. 7E, for fabricating the embodiment of FIG. 5A with thesingle cavity 20B, a suitable back side etch mask 66A can be formed onthe substrate 12A. The single cavity 20B, can then be formed using anetching process substantially as previously described. Alternately for aplastic substrate 12A, the cavity 20B can be formed using a micromolding process.

As shown in FIG. 7F, for introducing a fluid or gas pressure into thecavity 20B, the substrate 12A can be attached to a mounting substrate 68containing the pressure conduit 40. The mounting substrate 68 cancomprise a suitable material such as plastic or ceramic that is moldedor etched with the pressure conduit 40. In addition, the substrate 12Acan be attached to the mounting substrate 68 using a suitable adhesivesuch as silicone, such that a liquid or gas tight seal is formed betweenthe substrate 12A and the mounting substrate 68.

Referring to FIGS. 8A-8D, steps in a method for fabricating theinterconnect 10 with contacts 14A (FIG. 4) are illustrated. Initially,as shown in FIG. 8A, the substrate 12 can be provided, as previouslydescribed.

Next, as shown in FIG. 8B a front side etch mask 70 can be formed on thefront side 22 of the substrate 12, and used to etch the contact 14A,substantially as previously described. A representative height of thecontact 14A can be about 25 μm to 100 μm and a representative width canbe about 25 μm to 50 μm on a side. Similarly, a back side mask 72 can beformed on the back side 24 of the substrate 12 and used to etch thecavities 20 or 20A, substantially as previously described.

Next, as shown in FIG. 8C, the insulating layers 28 can be formed,substantially as previously described.

Next, as shown in FIG. 8D, the conductive layer 30A, conductor 32A, andbonding pad 34A can be formed substantially as previously described.

As shown in FIG. 8E, for the embodiment of FIG. 4A, the elastomer 46 canbe deposited within the cavity 20B. With the elastomer 46 comprisingsilicone or an elastomeric foam, the elastomer 46 can be deposited inviscous form using a suitable deposition apparatus, such as a nozzle orspatula, and then cured as required. Alternately, the elastomer 46 cancomprise a separate elastomeric member such as butyl rubber, placedwithin the cavity 20B and secured with an adhesive.

Referring to FIGS. 9A-9D steps in a method for fabricating theinterconnect 10 with contacts 14B (FIG. 5) are illustrated. Initially asshown in FIG. 9A, the substrate 12 can be provided as previouslydescribed.

Next, as shown in FIG. 9B, a front side etch mask 74 can be formed onthe front side 22 of the substrate 12, and used to etch the contact 14Bwith the projection 48, substantially as previously described.Similarly, a back side etch mask 76 can be formed on the back side 24 ofthe substrate 12 and used to etch the cavities 20 or 20A, substantiallyas previously described.

Next, as shown in FIG. 9C, the insulating layers 28 can be formedsubstantially as previously described.

Next, as shown in FIG. 9D, the conductive layer 30B, conductor 32B, andbonding pad 34B can be formed, substantially as previously described.

Referring to FIGS. 10A-10D steps in a method for fabricating theinterconnect 10 with contacts 14C (FIG. 6A) are illustrated. Initially,as shown in FIG. 10A, the substrate 12C can be provided as previouslydescribed.

Next, as shown in FIG. 10B a front side etch mask 78 can be formed onthe front side 22C of the substrate 12C, and used to etch the recess38C, substantially as previously described. If the substrate 12Ccomprises plastic, a micro molding process, or a laser machiningprocess, can be used to form the recess 38C.

Next, as shown in FIG. 10C, an opening 82 can be formed in the substrate12C. The opening 82 extends from the bottom surface of the cavity 38C tothe back side 24C of the substrate 12C, and will be used to form theconductive via 58 (FIG. 6A). One method for forming the opening 82 iswith a laser machining process. Suitable laser machining apparatusinclude the previously identified General Scanning and Synova units. Arepresentative diameter of the opening 82 can be from 10 μm to 2 mils orgreater. A representative laser fluence for forming the opening 82through a substrate 12C comprising silicon and having a thickness ofabout 28 mils is from 2 to 10 watts/per opening at a pulse duration of20-25 ns and at a repetition rate of up to several thousand per second.The wavelength of the laser beam can be a standard infrared or greenwavelength (e.g., 532 nm-1064 nm).

As also shown in FIG. 10C, the insulating layers 28C can be formedsubstantially as previously described. The insulating layers 28C coverexposed surfaces of the substrate 12C, including the recess 38C and theopening 82. If the substrate 12C comprises ceramic or plastic theinsulating layers 28C are not required.

Next, as shown in FIG. 10D, the opening 82 can be filled with aconductive material to form the conductive via 58. The conductivematerial can completely fill the opening 82, or alternately cover onlythe sidewalls of the opening 82. A suitable deposition process, such asCVD, electrolytic deposition, or electroless deposition can be used todeposit a conductive material such as nickel into the opening 82.Alternately, a solder alloy can be screen printed into the opening 82,or injected by capillary action. Also, rather than being a metal, theconductive material can comprise a conductive polymer, such as a metalfilled silicone, a carbon filled ink, or an isotropic or anisotropicadhesive.

As also shown in FIG. 10D, the conductive layer 30C can be formed usinga metallization process substantially as previously described. Inaddition, the contact pad 60 can be formed using a metallizationprocess. The conductive via 58 forms an electrical path between theconductive layer 30C and the contact pad 60.

Next as shown in FIG. 10E, the polymer tape 50 can be attached to thesubstrate 12C using the conductive polymer layer 62. Initially, theconductive polymer layer 62 can be deposited on the substrate 12C usinga suitable deposition process such as screen printing or stenciling, andthe polymer tape 50 can be attached to the conductive polymer layer 62.The conductive polymer layer 62 will electrically connect the conductivelayer 30C on the substrate 12C to the leads 52 on the polymer tape 50.In addition, the conductive polymer layer 62 functions to attach thepolymer tape 50 to the substrate 12C. The conductive polymer layer 62can comprise a metal filled silicone, a silver filled ink, an isotropicadhesive, or an anisotropic adhesive. Suitable conductive polymermaterials are sold by A.I. Technology, Trenton, N.J.; Sheldahl,Northfield, Minn.; 3M, St. Paul, Minn. Alternately rather than beinginitially applied to the substrate 12C, the conductive polymer layer 62can be initially applied to the polymer tape 50. In the case ofisotropic materials, the conductive polymer layer 62 can be formed onlyon selected portions of the substrate 12C to prevent shorting of thecontacts 14C.

The polymer tape 50 can be applied to the conductive polymer layer 62while it is in a viscous state. Curing of the conductive polymer layer62 can then be performed. Depending on the material, the conductivepolymer layer 62 can be cured using heat and compression as required.Prior to attaching the polymer tape 50 to the conductive polymer layer62, the leads 52 can be aligned with the recess 38C in the substrate12C. As previously explained, the polymer tape 50 can be similar tomulti layered TAB tape, and can be fabricated using techniques that areknown in the art. For example, the leads 52 can be formed in a desiredconfiguration on a polyimide film using an electrodeposition process.Also required features such as the opening 54 (FIG. 6A) can be formed inthe film as required.

Wafer Level Test System

Referring to FIG. 11, a wafer level test system 84W suitable for testinga wafer sized semiconductor component 10W with bumped contacts 16 isillustrated. The semiconductor component 10W can comprise asemiconductor wafer containing bare dice, a wafer or panel containingchip scale packages, a printed circuit board containing semiconductordice, or an electronic assembly, such as a field emission displaycontaining semiconductor dice.

The wafer level test system 84W includes an interconnect 10W-1constructed in accordance with the invention as previously described,and mounted to a testing apparatus 86W. The testing apparatus 86Wincludes, or is in electrical communication with test circuitry 88. Thetesting apparatus 86W can comprise a conventional wafer probe handler,or probe tester, modified for use with the interconnect 10W-1. Thetesting apparatus 86W can also comprise a wafer level burn-in system.Wafer probe handlers and associated test equipment are commerciallyavailable from Electroglass, Advantest, Teradyne, Megatest,Hewlett-Packard and others. In this system 84W, the interconnect 10W-1takes the place of a conventional probe card.

The interconnect 10W-1 includes the previously described interconnectcontacts 14C configured to establish electrical communication with thebumped contacts 16 on the component low. In addition, the leads 52 (FIG.6B) on the interconnect contacts 14C can move independently in thez-direction to accommodate variations in the size and planarity of thebumped contacts 16. The interconnect 10W-1 also includes the previouslydescribed conductive vias 58 in electrical communication with thecontacts 14C and the contact pads 60. Alternately, the interconnect10W-1 can be configured with previously described contacts 14, 14A or14B.

The testing apparatus 86W also includes a wafer chuck 90 configured tosupport and move the component 18W in x, y and z directions as required.In particular, the wafer chuck 90 can be used to step the component 18Wso that the semiconductor dice or semiconductor packages on thecomponent 18W can be tested in groups. Alternately, the interconnect10W-1 can be configured to contact all of the bumped contacts 16 for allof the dice on the component 18W at the same time. Test signals can thenbe selectively applied and electronically switched as required, toselected dice on the component 18W.

As also shown in FIG. 11, the interconnect 10W-1 can mount to a probecard fixture 92 of the testing apparatus 86W. The probe card fixture 92can be similar in construction to a conventional probe card fixturecommercially available from manufacturers such as Packard HughesInterconnect and Wentworth Laboratories. The probe card fixture 92 canbe formed of an electrically insulating material such as FR-4 orceramic. In addition, the testing apparatus 86W can include a forceapplying mechanism in the form of multiple spring loaded electricalconnectors 94 associated with the probe card fixture 92. The springloaded electrical connectors 94 are in electrical communication with thetesting circuitry 88.

The spring loaded electrical connectors 94 can be formed in a variety ofconfigurations. One suitable configuration is known as a “POGO PIN”connector. This type of electrical connector includes a spring loadedpin adapted to contact and press against a flat or bumped surface toform an electrical connection. Pogo pin connectors are manufactured byPogo Instruments, Inc., Kansas City, Kans. The spring loaded electricalconnectors 94 can also comprise wires, pins or cables formed as springsegments or other resilient members.

In this embodiment the spring loaded electrical connectors 94electrically contact the contact pads 60 formed on the interconnect10W-1. This arrangement provides separate electrical paths from thetesting circuitry 88, through the spring loaded electrical connectors94, through the contact pads 60, through the conductive vias 58 andthrough the contacts 14C to the bumped contacts 16. During a testprocedure, test signals can be applied to the integrated circuits on thecomponent 18W using these separate electrical paths.

In addition to establishing electrical communication with theinterconnect 10W-1, the spring loaded electrical connectors 94 alsoprovide a mechanical force necessary for biasing the interconnect 10W-1against the component 18W. Further details of a wafer level systemsimilar to the system 86W are contained in U.S. patent application Ser.No. 08/797,719, filed Feb. 10, 1997, entitled “PROBE CARD FORSEMICONDUCTOR WAFERS AND METHOD AND SYSTEM FOR TESTING WAFERS” which isincorporated herein by reference.

Referring to FIG. 11A, an alternate embodiment wafer level test system84W-2 is illustrated. The wafer level test system 84W-2 includes aninterconnect 10W-2 that takes the place of a conventional probe card ona wafer probe handler substantially as previously described forinterconnect 10W (FIG. 11). The interconnect 10W-2 includes contacts 16and cavities 20 formed substantially as previously described. Inaddition, the interconnect 10W-2 is mounted to a mounting substrate 68Wthat is configured to seal the cavities 20, such that fluid or gaspressure can be introduced through pressure conduits 40 into thecavities 20. The mounting plate 68W includes contact pads 128 wirebonded to wires 44. The wires 44 are also wire bonded to the bondingpads 34 (FIG. 1) on the interconnect 10W-2 and are thus in electricalcommunication with the contacts 14. The contact pads 128 are configuredfor electrical engagement by spring loaded electrical connectors 94 inelectrical communication with test circuitry 88. In this embodiment, thepressure within the cavities 20 can be controlled to exert a selectedbackside biasing force on the contacts 14, substantially as previouslydescribed.

Die Level Test System

Referring to FIGS. 12A-12B, a die level test system 84D constructed witha die level interconnect 10D is illustrated. The test system 84Dcomprises a test carrier adapted to temporarily package a die-sizedsemiconductor component 18D, such as a bare die, or a chip scalepackage, for testing and burn-in.

The test system 84D includes a base 96, and the interconnect 10D mountedto the base 96. The test system 84D also includes a force applyingmechanism 64 comprising a biasing member 100, a pressure plate 102, anda clamp 104. In addition, the base 96 includes a plurality of terminalleads 106 in electrical communication with the interconnect contacts 14(FIG. 3), 14A (FIG. 4), 14B (FIG. 5A) or 14C (FIG. 6A) on theinterconnect 10D.

The terminal leads 106 are adapted for electrical communication with atest apparatus 108 (FIG. 12B), such as a burn-in board, and testcircuitry 88 (FIG. 12B). The test circuitry 88 generates test signals,and transmits the test signals to the terminal leads 106, and throughthe interconnect 10D to the component 18D. The test circuitry 88 alsoanalyzes the resultant test signals transmitted from the component 18D.This arrangement permits various electrical characteristics of thecomponent 18D to be evaluated.

In the illustrative embodiment, the terminal leads 106 comprise pinsformed in a pin grid array (PGA) on a backside of the base 96.Alternately, other configurations for the terminal leads 106 can beprovided. For example, the carrier base 96 can include ball contacts ina ball grid array (BGA) or fine ball grid array (FBGA).

The base 96 can comprise a laminated ceramic material fabricated using aceramic lamination process with a desired geometry, and with metalfeatures such as internal conductors and external pads. U.S. Pat. No.5,519,332, entitled “Carrier For Testing An Unpackaged SemiconductorDie”, which is incorporated herein by reference, describes a ceramiclamination process for fabricating the base 96. Alternately, rather thanceramic, the base 96 can comprise plastic, and the metal features formedusing a 3-D molding process. Previously cited U.S. Pat. No. 5,519,332describes a 3-D molding process for fabricating the base 96.

The base 96 includes internal conductors (not shown) in electricalcommunication with the terminal leads 106. In addition, the bond wires44 are wire bonded to bond pads on the base 96 in electricalcommunication with the internal conductors in the base 96. The bondwires 44 are also wire bonded to the bonding pads 34 (FIG. 3) on theinterconnect 10D, and establish electrical communication between theterminal leads 106 on the base 96, and the interconnect contacts 14(FIG. 3), 14A (FIG. 4), 14B (FIG. 5A) or 14C (FIG. 6A) on theinterconnect 10D.

The base 96 also includes a clamp ring 110 for attaching the clamp 104of the force applying mechanism 98 to the base 96 during assembly of thetest system 84D. The clamp ring 110 is attached to the base 96, and asshown in FIG. 12A, has a frame-like configuration. As also shown in FIG.12B, the clamp ring 110 includes grooves 112 wherein the clamp 104 isattached. In the illustrative embodiment, the clamp ring 110 comprisesmetal, and is attached to the base 96 using a brazing process. Onesuitable metal for the clamp ring 110 comprises “KOVAR” coated withgold. The base 96 can include bonding features, such as metal pads, forattaching the clamp ring 110.

The clamp 104 comprises a flexible bridge-like structure formed of aresilient material such as steel. The clamp 104 includes tabs 114 thatphysically engage the grooves 112 on the clamp ring 110. In addition,the clamp 104 includes opposed sides 116 movable towards one another topermit engagement of the tabs 114 on the clamp 104, with the grooves 112on the clamp ring 110. The clamp 104 also includes an opening 118 whichprovides access to the component 18D for a vacuum assembly tool duringassembly of the test system 84D. The biasing member 100 also includes anopening 120, and the pressure plate 102 includes an opening 122 for thevacuum assembly tool. A pair of openings 124 (FIG. 12A) can also beprovided on the clamp 104 for manipulation of the clamp 104 by thevacuum assembly tool during assembly of the test system 84D.

The pressure plate 102 can comprise a metal, a plastic, or a ceramicmaterial. A peripheral shape and thickness of the pressure plate 102 canbe selected as required.

Assembly of the test system 84D can be accomplished manually, or usingan automated assembly apparatus. U.S. Pat. No. 5,796,264, entitled“Apparatus For Manufacturing Known Good Semiconductor Dice”, which isincorporated herein by reference, describes a method and apparatus forassembling the carrier. In the illustrative embodiment, alignment of thecomponent 18D with the interconnect 10D can be performed using anoptical alignment technique. Such an optical alignment technique isdescribed in the above cited U.S. Pat. No. 5,796,264. Alignment of thecomponent 18D with the interconnect 10D can also be performed using amechanical alignment fence.

Using the test system 84D the component 18D can be tested as required.In addition, the interconnect contacts 14 (FIG. 3), 14A (FIG. 4), 14B(FIG. 5A) or 14C (FIG. 6A) can move independently as previouslydescribed to accommodate variations in the size and planarity of thebumped contacts 16 on the component 18D.

Thus the invention provides an improved interconnect for testingsemiconductor components having bumped contacts. The interconnectinclude contacts designed to provide a reliable electrical connection tothe bumped contacts with a minimal application of contact force. Inaddition, the contacts are constructed to move independently in thez-direction to accommodate variations in the size and planarity of thebumped contacts.

While the invention has been described with reference to certainpreferred embodiments, as will be apparent to those skilled in the art,certain changes and modifications can be made without departing from thescope of the invention as defined by the following claims.

1. A test system for testing a semiconductor component having a terminalcontact comprising: a testing apparatus in electrical communication withtest circuitry; an interconnect on the testing apparatus comprising acontact in electrical communication with the test circuitry configuredto electrically engage the terminal contact on the component; a recesson the interconnect aligned with the contact forming a flexible segmentwhich allows the contact to flex during electrical engagement of theterminal contact; and a polymer material in the recess configured toadjust a compliancy of the flexible segment.
 2. The test system of claim1 wherein the testing apparatus comprises a wafer probe tester or awafer burn-in tester.
 3. The test system of claim 1 wherein the testingapparatus comprises a carrier for retaining the semiconductor component.4. The test system of claim 1 wherein the terminal contact comprises abump and the contact comprises a recess configured to retain the bump.5. The test system of claim 1 wherein the contact comprises a projectionon the flexible segment configured to penetrate the terminal contact. 6.A test system for testing a semiconductor component having a terminalcontact comprising: a testing apparatus in electrical communication witha test circuitry; and an interconnect on the testing apparatuscomprising a contact in electrical communication with the test circuitrycomprising a projection and a conductive layer configured toelectrically engage the terminal contact, and a cavity proximate to thecontact containing a polymer material, the cavity forming a flexiblesegment which allows the contact to flex during electrical engagement ofthe terminal contact.
 7. The test system of claim 6 wherein the testingapparatus comprises a probe tester or a burn-in tester.
 8. The testsystem of claim 6 wherein the testing apparatus comprises a carrierconfigured to retain the semiconductor component.
 9. The test system ofclaim 6 wherein the polymer material comprises a material selected fromthe group consisting of silicone, rubber, and elastomeric foam.
 10. Thetest system of claim 6 wherein the cavity aligns with the projection.11. A test system for testing a semiconductor component having aterminal contact comprising: a test circuitry configured to apply testsignals to the component; an interconnect having a substrate with afirst side and an opposing second side, a cavity on the second side, aflexible segment of the substrate formed by the cavity, a polymermaterial within the cavity, and a contact on the flexible segmentconfigured to electrically engage the terminal contact on the component;and a testing apparatus configured to hold the interconnect and thecomponent and to place the contact in electrical engagement with theterminal contact.
 12. The test system of claim 11 wherein the contactcomprises a projection on the flexible segment configured to penetratethe terminal contact.
 13. The test system of claim 11 wherein thecontact comprises a recess configured to retain the terminal contact.14. The test system of claim 11 wherein the polymer material comprises amaterial selected from the group consisting of silicone, rubber, andelastomeric foam.
 15. The test system of claim 11 wherein the testingapparatus comprises a probe tester or a burn-in tester.
 16. The testsystem of claim 11 wherein the testing apparatus comprises a carrierconfigured to retain the semiconductor component.
 17. The test system ofclaim 11 wherein the interconnect further comprises a conductive via inelectrical communication with the contact and a second contact on thesecond side configured to establish electrical communication with thetest circuitry.
 18. The test system of claim 11 wherein the contactcomprises a conductive layer and a conductor on the first side inelectrical communication with the conductive layer.
 19. The test systemof claim 11 wherein the terminal contact comprises a bump and thecontact comprises a projection at least partially covered with aconductive layer configured to penetrate the bump.
 20. The test systemof claim 11 wherein the terminal contact comprises a bump and thecontact comprises a recess at least partially covered with a conductivelayer configured to retain the bump.
 21. The test system of claim 11wherein the semiconductor component comprises a semiconductor wafer or asemiconductor die.